Remote Tracking of Phase Changes in Cr2AlC Thin Films by In-situ Resistivity 
Measurements

Stelzer, Bastian; Chen, Xiang; Bliem, Pascal; Hans, Marcus; Völker, Bernhard; Sahu, Rajib; Scheu, Christina; Primetzhofer, Daniel; Schneider, Jochen Michael

doi:10.1038/s41598-019-44692-4

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Remote Tracking of Phase Changes in Cr₂AlC Thin Films by In-situ Resistivity Measurements

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Völker, Bernhard
Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Sahu, Rajib
Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Scheu, Christina
Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Stelzer, B., Chen, X., Bliem, P., Hans, M., Völker, B., Sahu, R., et al. (2019). Remote Tracking of Phase Changes in Cr₂AlC Thin Films by In-situ Resistivity Measurements. Scientific Reports, 9: 8266. doi:10.1038/s41598-019-44692-4.

Cite as: https://hdl.handle.net/21.11116/0000-0005-738A-E

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