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Journal Article

Remote Tracking of Phase Changes in Cr2AlC Thin Films by In-situ Resistivity Measurements

MPS-Authors
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Völker,  Bernhard
Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Sahu,  Rajib
Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Scheu,  Christina
Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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s41598-019-44692-4.pdf
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Citation

Stelzer, B., Chen, X., Bliem, P., Hans, M., Völker, B., Sahu, R., et al. (2019). Remote Tracking of Phase Changes in Cr2AlC Thin Films by In-situ Resistivity Measurements. Scientific Reports, 9: 8266. doi:10.1038/s41598-019-44692-4.


Cite as: http://hdl.handle.net/21.11116/0000-0005-738A-E
Abstract
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