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Workflow for focused Ion Beam Tomography of large Volumes

MPS-Authors
/persons/resource/persons182766

Rüttgers,  Angelika
Electron Microscopy and Analytics, Center of Advanced European Studies and Research (caesar), Max Planck Society;

Schulz,  Kathrin
Electron Microscopy and Analytics, Center of Advanced European Studies and Research (caesar), Max Planck Society;

/persons/resource/persons182739

Irsen,  Stephan
Electron Microscopy and Analytics, Center of Advanced European Studies and Research (caesar), Max Planck Society;

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Rüttgers, A., Schulz, K., & Irsen, S. (2019). Workflow for focused Ion Beam Tomography of large Volumes. Poster presented at Microscopy Conference MC 2019, organized by DGE Deutsche Gesellschaft für Elektronenmikroskopie e. V. (German Society for Electron Microscopy), Berlin.


Cite as: http://hdl.handle.net/21.11116/0000-0005-785A-0
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