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Strukturuntersuchung von epitaktischen CrSi2 Schichten auf Si(001) mittels TEM

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Henning, A., Reichel, R., Filonenko, O., Hortenbach, H., Falke, M., Beddies, G., et al. (2002). Strukturuntersuchung von epitaktischen CrSi2 Schichten auf Si(001) mittels TEM. Poster presented at Frühjahrstagung des Arbeitskreises Festkörperphysik (AKF) der Deutschen Physikalischen Gesellschaft, Augsburg, Germany.


Cite as: http://hdl.handle.net/21.11116/0000-0005-9D87-2
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