Generation and characterization of focused helical x-ray beams

Loetgering, L.; Baluktsian, M.; Keskinbora, K.; Horstmeyer, R.; Wilhein, T.; Schütz, G.; Eikema, K. S. E.; Witte, S.

doi:10.1126/sciadv.aax8836

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Generation and characterization of focused helical x-ray beams

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Baluktsian, M.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Keskinbora, K.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Schütz, G.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Loetgering, L., Baluktsian, M., Keskinbora, K., Horstmeyer, R., Wilhein, T., Schütz, G., et al. (2020). Generation and characterization of focused helical x-ray beams. Science Advances, 6(7): eaax8836. doi:10.1126/sciadv.aax8836.

Cite as: https://hdl.handle.net/21.11116/0000-0005-B604-9

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