Advanced transmission electron microscopy of nanomaterials using In-situ TEM 
and precession electron diffraction

Jeong, Jiwon

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Advanced transmission electron microscopy of nanomaterials using In-situ TEM and precession electron diffraction

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Jeong, Jiwon
Advanced Transmission Electron Microscopy, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Jeong, J. (2019). Advanced transmission electron microscopy of nanomaterials using In-situ TEM and precession electron diffraction. Talk presented at Seminar, Korea Institute of Science and Technology (KIST). Seoul, South Korea. 2019-11-04.

Cite as: https://hdl.handle.net/21.11116/0000-0005-DE67-E

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