English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT

Released

Talk

Advanced transmission electron microscopy of nanomaterials using In-situ TEM and precession electron diffraction

MPS-Authors
/persons/resource/persons243150

Jeong,  Jiwon
Advanced Transmission Electron Microscopy, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

External Resource
No external resources are shared
Fulltext (restricted access)
There are currently no full texts shared for your IP range.
Fulltext (public)
There are no public fulltexts stored in PuRe
Supplementary Material (public)
There is no public supplementary material available
Citation

Jeong, J. (2019). Advanced transmission electron microscopy of nanomaterials using In-situ TEM and precession electron diffraction. Talk presented at Seminar, Korea Institute of Materials Science (KIMS). Seoul, South Korea. 2019-11-08.


Cite as: https://hdl.handle.net/21.11116/0000-0005-DE6E-7
Abstract
There is no abstract available