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Advanced transmission electron microscopy of nanomaterials using In-situ TEM and precession electron diffraction

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Jeong,  Jiwon
Advanced Transmission Electron Microscopy, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Jeong, J. (2019). Advanced transmission electron microscopy of nanomaterials using In-situ TEM and precession electron diffraction. Talk presented at Seminar, Korea Institute of Materials Science (KIMS). Seoul, South Korea. 2019-11-08.


Cite as: http://hdl.handle.net/21.11116/0000-0005-DE6E-7
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