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Direct Imaging of Dopant and Impurity Distributions in 2D MoS2

MPS-Authors
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Kim,  Se-Ho
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Lim,  Joohyun
Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Sahu,  Rajib
Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Kasian,  Olga
Electrocatalysis, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;
Helmholtz Zentrum Berlin, Helmholtz-Institute Erlangen-Nürnberg, 14109 Berlin, Germany;

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Stephenson,  Leigh
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Scheu,  Christina
Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Gault,  Baptiste
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;
Imperial College, Royal School of Mines, Department of Materials, London, SW7 2AZ, UK;

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adma.201907235.pdf
(Supplementary material), 2MB

Citation

Kim, S.-H., Lim, J., Sahu, R., Kasian, O., Stephenson, L., Scheu, C., et al. (2020). Direct Imaging of Dopant and Impurity Distributions in 2D MoS2. Advanced Materials, 32(8): 1907235. doi:10.1002/adma.201907235.


Cite as: http://hdl.handle.net/21.11116/0000-0006-0690-0
Abstract
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