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Journal Article

Atomic‐Scale Mapping of Impurities in Partially Reduced Hollow TiO2 Nanowires

MPS-Authors
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Lim,  Joohyun
Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Kim,  Se-Ho
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;
Hydrogen in Energy Materials, Project Groups, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Aymerich Armengol,  Raquel
Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Kasian,  Olga
Electrocatalysis, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;
Helmholtz Zentrum Berlin, Helmholtz-Institute Erlangen-Nürnberg, 14109 Berlin, Germany;

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Stephenson,  Leigh
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;
Hydrogen in Energy Materials, Project Groups, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Gault,  Baptiste
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;
Imperial College, Royal School of Mines, Department of Materials, London, SW7 2AZ, UK;
Hydrogen in Energy Materials, Project Groups, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Scheu,  Christina
Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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anie.201915709.pdf
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Citation

Lim, J., Kim, S.-H., Aymerich Armengol, R., Kasian, O., Choi, P.-P., Stephenson, L., et al. (2020). Atomic‐Scale Mapping of Impurities in Partially Reduced Hollow TiO2 Nanowires. Angewandte Chemie, International Edition in English, 59(14), 5651-5655. doi:10.1002/anie.201915709.


Cite as: http://hdl.handle.net/21.11116/0000-0006-0688-A
Abstract
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