Characterization of e-beam evaporated Ge, YbF3, ZnS, and LaF3 ,thin films for 
laser-oriented coatings

Amotchkina, Tatiana; Trubetskov, Michael K.; Hahner, Daniel; Pervak, Vladimir

doi:10.1364/AO.59.000A40

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Characterization of e-beam evaporated Ge, YbF₃, ZnS, and LaF₃ ,thin films for laser-oriented coatings

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Trubetskov, Michael K.
Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society;

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Amotchkina, T., Trubetskov, M. K., Hahner, D., & Pervak, V. (2020). Characterization of e-beam evaporated Ge, YbF₃, ZnS, and LaF₃,thin films for laser-oriented coatings. Applied Optics, 59(5), A40-A47. doi:10.1364/AO.59.000A40.

Cite as: https://hdl.handle.net/21.11116/0000-0005-F299-D

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