English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
Add to Basket
  Local TagsRelease HistoryDetailsSummary

Released
Journal Article

Strain‐Visualization with Ultrasensitive Nanoscale Crack‐Based Sensor Assembled with Hierarchical Thermochromic Membrane

MPS-Authors
/persons/resource/persons246990

Tahk,  Dongha
Dept. Physical Intelligence, Max Planck Institute for Intelligent Systems, Max Planck Society;

External Resource
No external resources are shared
Fulltext (restricted access)
There are currently no full texts shared for your IP range.
Fulltext (public)
There are no public fulltexts stored in PuRe
Supplementary Material (public)
There is no public supplementary material available
Citation

Park, B., Kim, J. U., Kim, J., Tahk, D., Jeong, C., Ok, J., et al. (2019). Strain‐Visualization with Ultrasensitive Nanoscale Crack‐Based Sensor Assembled with Hierarchical Thermochromic Membrane. Advanced Functional Materials, 29(40): 1903360. doi:10.1002/adfm.201903360.


Cite as: https://hdl.handle.net/21.11116/0000-0006-16E6-E
Abstract
There is no abstract available