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A UHV-compatible photoelectron emission microscope for applications in surface science

MPS-Authors
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Engel,  Wilfried
Inorganic Chemistry, Fritz Haber Institute, Max Planck Society;

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Kordesch,  Martin E.
Fritz Haber Institute, Max Planck Society;

/persons/resource/persons22027

Rotermund,  Harm-Hinrich
Physical Chemistry, Fritz Haber Institute, Max Planck Society;

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Kubala,  Sven
Physical Chemistry, Fritz Haber Institute, Max Planck Society;

/persons/resource/persons21920

Oertzen,  Alexander von
Physical Chemistry, Fritz Haber Institute, Max Planck Society;

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Citation

Engel, W., Kordesch, M. E., Rotermund, H.-H., Kubala, S., & Oertzen, A. v. (1991). A UHV-compatible photoelectron emission microscope for applications in surface science. Ultramicroscopy, 36(1-3), 148-153. doi:10.1016/0304-3991(91)90146-W.


Cite as: https://hdl.handle.net/21.11116/0000-0006-649F-7
Abstract
A three-stage electrostatic photoelectron emission microscope (PEEM) for use as an attachment on a UHV surface analysis chamber is described. The PEEM is intended for surface studies with lateral resolution of the order of 0 1 pm where the real-time observation of processes is important.