Thin-Film Microtensile-Test Structures for High-Throughput Characterization of 
Mechanical Properties

Oellers, Tobias; Arigela, Viswanadh Gowtham; Kirchlechner, Christoph; Dehm, Gerhard; Ludwig, Alfred

doi:10.1021/acscombsci.9b00182

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Thin-Film Microtensile-Test Structures for High-Throughput Characterization of Mechanical Properties

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Arigela, Viswanadh Gowtham
Nano-/ Micromechanics of Materials, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Kirchlechner, Christoph
Nano-/ Micromechanics of Materials, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Dehm, Gerhard
Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Oellers, T., Arigela, V. G., Kirchlechner, C., Dehm, G., & Ludwig, A. (2020). Thin-Film Microtensile-Test Structures for High-Throughput Characterization of Mechanical Properties. ACS Combinatorial Science, 22(3), 142-149. doi:10.1021/acscombsci.9b00182.

Cite as: https://hdl.handle.net/21.11116/0000-0006-AFA5-B

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