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Thin-Film Microtensile-Test Structures for High-Throughput Characterization of Mechanical Properties

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Arigela,  Viswanadh Gowtham
Nano-/ Micromechanics of Materials, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Kirchlechner,  Christoph
Nano-/ Micromechanics of Materials, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Dehm,  Gerhard
Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Citation

Oellers, T., Arigela, V. G., Kirchlechner, C., Dehm, G., & Ludwig, A. (2020). Thin-Film Microtensile-Test Structures for High-Throughput Characterization of Mechanical Properties. ACS Combinatorial Science, 22(3), 142-149. doi:10.1021/acscombsci.9b00182.


Cite as: http://hdl.handle.net/21.11116/0000-0006-AFA5-B
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