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Journal Article

Revealing nano-chemistry at lattice defects in thermoelectric materials using atom probe tomography

MPS-Authors
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Zhang,  Siyuan
Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Scheu,  Christina
Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Raabe,  Dierk
Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Gault,  Baptiste
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;
Imperial College, Royal School of Mines, Department of Materials, London, SW7 2AZ, UK;

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Citation

Yu, Y., Zhou, C., Zhang, S., Zhu, M., Wuttig, M., Scheu, C., et al. (2020). Revealing nano-chemistry at lattice defects in thermoelectric materials using atom probe tomography. Materials Today, 32, 260-274. doi:10.1016/j.mattod.2019.11.010.


Cite as: https://hdl.handle.net/21.11116/0000-0006-CF6A-B
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