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Journal Article

Structure and vibrational dynamics of interfacial Sn layers in Sn/Si multilayers

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Roldan Cuenya, B., Keune, W., Sturhahn, W., Toellner, T. S., & Hu, M. Y. (2001). Structure and vibrational dynamics of interfacial Sn layers in Sn/Si multilayers. Physical Review B, 64(23): 235321. doi:10.1103/PhysRevB.64.235321.

Cite as: https://hdl.handle.net/21.11116/0000-0006-EC0F-1
The structure and vibrational dynamics of room-temperature-grown nanoscale Sn/amorphous (a-)Si multilayers have been studied by x-ray diffraction, Raman scattering, 119Sn Mössbauer spectroscopy, and 119Sn nuclear-resonant inelastic x-ray scattering (NRIXS) of synchrotron radiation. With increasing Sn-layer thickness, the formation of β-Sn was observed, except at the Sn/Si interfaces, where a 10-Å-thick metastable pure amorphous-α-Sn-like layer remains stabilized. By means of NRIXS we have measured the Sn-projected vibrational density of states (VDOS) in these multilayers (in particular, at the interfaces), and in 500-Å-thick epitaxial α-Sn films on InSb(001) as a reference. Further, the Sn-specific Lamb-Mössbauer factor (f factor), mean kinetic energy per atom, mean atomic force constant, and vibrational entropy per atom were obtained. The VDOS of the amorphous-α-Sn-like interface layer is observed to be distinctly different from that of (bulk) α-Sn and β-Sn, and its prominent vibrational energies are found to scale with those of amorphous Ge and Si. The observed small difference in vibrational entropy (ΔS/kB=+0.17±0.05 per atom) between α-Sn and interfacial amorphous-α-like Sn does not account for the stability of the latter phase.