3-Dimensional analysis of layer structured samples with high depth resolution 
using picosecond laser-induced breakdown spectroscopy

Yi, R.; Zhao, D.; Oelmann, J.; Brezinsek, S.; Rasinski, M.; Mayer, M.; Dhard, C. P.; Naujoks, D.; Liu, L.; Quath, J.; W7-X Team, Max Planck Institute for Plasma Physics, Max Planck Society

doi:10.1016/j.apsusc.2020.147185

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3-Dimensional analysis of layer structured samples with high depth resolution using picosecond laser-induced breakdown spectroscopy

MPS-Authors

/persons/resource/persons109910

Mayer, M.
Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society;

/persons/resource/persons108932

Dhard, C. P.
Stellarator Edge and Divertor Physics (E4), Max Planck Institute for Plasma Physics, Max Planck Society;

/persons/resource/persons110035

Naujoks, D.
W7-X: Operations (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

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https://doi.org/10.1016/j.apsusc.2020.147185
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Citation

Yi, R., Zhao, D., Oelmann, J., Brezinsek, S., Rasinski, M., Mayer, M., et al. (2020). 3-Dimensional analysis of layer structured samples with high depth resolution using picosecond laser-induced breakdown spectroscopy. Applied Surface Science, 532: 147185. doi:10.1016/j.apsusc.2020.147185.

Cite as: https://hdl.handle.net/21.11116/0000-0007-00CE-1

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