NEXAFS of the p(2 × 2) and (√3 × √3)R 30°-O-Ni(111) systems: a multiple 
scattering analysis

Pedio, M; Becker, L.; Hillert, B.; Addato, S. D.; Haase, J.

doi:10.1016/0042-207X(90)90479-I

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NEXAFS of the p(2 × 2) and (√3 × √3)R 30°-O-Ni(111) systems: a multiple scattering analysis

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Becker, L.
Fritz Haber Institute, Max Planck Society;

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Hillert, B.
Fritz Haber Institute, Max Planck Society;

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Haase, J.
Fritz Haber Institute, Max Planck Society;

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Citation

Pedio, M., Becker, L., Hillert, B., Addato, S. D., & Haase, J. (1990). NEXAFS of the p(2 × 2) and (√3 × √3)R 30°-O-Ni(111) systems: a multiple scattering analysis. Vacuum, 41(1-3), 741-742. doi:10.1016/0042-207X(90)90479-I.

Cite as: https://hdl.handle.net/21.11116/0000-0007-1A85-6

Abstract

The near-edge X-ray adsorption fine structure (NEXAFS) yields information on both the geometric and electronic structure. In surface science this technique up to now has been mainly used to determine the geometric structure of atomic and molecular adsorbates on solid surfaces. In particular, multiple scattering (MS) calculations in a real space cluster model^1-5 provide direct information on the local geometry of atomic adsorbates.