User Manual Privacy Policy Disclaimer Contact us
  Advanced SearchBrowse





An extreme-ultraviolet frequency comb enabling frequency metrology with highly charged ions


Nauta,  Janko
Division Prof. Dr. Thomas Pfeifer, MPI for Nuclear Physics, Max Planck Society;

External Ressource
Fulltext (public)
There are no public fulltexts stored in PuRe
Supplementary Material (public)
There is no public supplementary material available

Nauta, J. (2020). An extreme-ultraviolet frequency comb enabling frequency metrology with highly charged ions. PhD Thesis, Ruprecht-Karls-Universität, Heidelberg.

Cite as: http://hdl.handle.net/21.11116/0000-0007-636C-1
An extreme ultraviolet frequency comb for highly charged ion metrology Highly charged ions (HCI) have been proposed as extremely sensitive probes for physics beyond the Standard Model, such as a possible α-variation, and as novel frequency standards, due to their insensitivity to external fields. We aim at performing ultra-high precision spectroscopy of HCI in the extreme ultraviolet (XUV) region, where many transitions are located. Therefore, we have developed an XUV frequency comb. Femtosecond pulses from a 100MHz phase-stabilized near-infrared comb are amplified and fed into an enhancement cavity inside an ultra-high vacuum chamber. In the tight focus (w0 = 15 μm) of the astigmatism-compensated cavity, intensities ~1014 W/cm2 are reached. As a first application, we perform multi-photon ionization of xenon using the velocity-map imaging technique. The high repetition rate facilitates fast data acquisition even at low intensities, enabling future precision tests in nonlinear physics. Finally, we have observed outcoupled XUV radiation, produced in the cavity focus, up to the 35th harmonic order (42 eV; 30 nm). No signs of mirror degradation were observed during five hours of continuous operation. Using He:Xe gas mixtures, improved phase-matching conditions led to 49 μW output power at 16 eV. This is sufficient to drive HCI transitions with kHz excitation rates and is an important step towards XUV frequency metrology with HCI.