Item

Abstract

In the past Scanning Kelvin Probe Force Microscopy (SKPFM) has been
established to investigate potential distributions on microelectronic
devices (1). First efforts have been made to introduce this technique in
the characterization of alloys (2). The SKPFM allows potential and
topographic mapping with submicrometer resolution. Nonetheless, there
has been no work reported on in situ investigations of delamination. Our
recent research includes the detection of microscopic aspects of
cathodic delamination on model samples and on filiform corrosion (FFC)
on aluminum. To keep the corrosion under the AFM set-up active, a
custom-made glass cabin was used. In addition, optical microscopy and
surface analytical techniques have been used to characterize the sample
behaviour. Parameters for a reasonable in situ use of SKPFM have been
investigated.