English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse
  1. View item / 
  2. Item Summary

Item

ITEM ACTIONSEXPORT
Add to Basket
  Local TagsRelease HistoryDetailsSummary

Released
Journal Article

Dynamic Effects in Voltage Pulsed Atom Probe

MPS-Authors
/persons/resource/persons256287

Morgado,  Felipe Ferraz
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

/persons/resource/persons208581

Stephenson,  Leigh
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

/persons/resource/persons185411

Gault,  Baptiste
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;
Imperial College, Royal School of Mines, Department of Materials, London, SW7 2AZ, UK;

External Resource
No external resources are shared
Fulltext (restricted access)
There are currently no full texts shared for your IP range.
Fulltext (public)
There are no public fulltexts stored in PuRe
Supplementary Material (public)
There is no public supplementary material available
Citation

Rousseau, L., Normand, A., Morgado, F. F., Stephenson, L., Gault, B., Tehrani, K., et al. (2020). Dynamic Effects in Voltage Pulsed Atom Probe. Microscopy and Microanalysis, 26(6), 1133-1146. doi:10.1017/S1431927620024587.


Cite as: https://hdl.handle.net/21.11116/0000-0007-E0B8-C
Abstract
There is no abstract available