Direct measurement of key exciton properties: Energy, dynamics, and spatial 
distribution of the wave function

Dong, Shuo; Puppin, Michele; Pincelli, Tommaso; Beaulieu, Samuel; Christiansen, Dominik; Hübener, Hannes; Nicholson, Christopher W.; Xian, R. Patrick; Dendzik, Maciej Ramon; Deng, Yunpei; Windsor, Yoav William; Selig, Malte; Malic, Ermin; Rubio, Angel; Knorr, Andreas; Wolf, Martin; Rettig, Laurenz; Ernstorfer, Ralph

doi:10.1002/ntls.10010

Datensatz

DATENSATZ AKTIONENEXPORT

Zur Ablage hinzufügen

Lokale TagsFreigabegeschichteDetailsÜbersicht

Freigegeben

Zeitschriftenartikel

Direct measurement of key exciton properties: Energy, dynamics, and spatial distribution of the wave function

MPG-Autoren

/persons/resource/persons206871

Dong, Shuo
Physical Chemistry, Fritz Haber Institute, Max Planck Society;

/persons/resource/persons32746

Puppin, Michele
Physical Chemistry, Fritz Haber Institute, Max Planck Society;
Laboratoire de Spectroscopie Ultrarapide and Lausanne Centre for Ultrafast Science (LACUS), Ecole polytechnique federale de Lausanne;

/persons/resource/persons227631

Pincelli, Tommaso
Physical Chemistry, Fritz Haber Institute, Max Planck Society;

/persons/resource/persons227651

Beaulieu, Samuel
Physical Chemistry, Fritz Haber Institute, Max Planck Society;

Hübener, Hannes
Max Planck Institute for the Structure and Dynamics of Matter, Max Planck Society;

/persons/resource/persons61173

Nicholson, Christopher W.
Physical Chemistry, Fritz Haber Institute, Max Planck Society;
Departement de Physique and Fribourg Center for Nanomaterials, Universite de Fribourg;

/persons/resource/persons136124

Xian, R. Patrick
Physical Chemistry, Fritz Haber Institute, Max Planck Society;

/persons/resource/persons205838

Dendzik, Maciej Ramon
Physical Chemistry, Fritz Haber Institute, Max Planck Society;
Department of Applied Physics, KTH Royal Institute of Technology;

/persons/resource/persons84708

Deng, Yunpei
Physical Chemistry, Fritz Haber Institute, Max Planck Society;
SwissFEL, Paul Scherrer Institute;

/persons/resource/persons203272

Windsor, Yoav William
Physical Chemistry, Fritz Haber Institute, Max Planck Society;

Rubio, Angel
Max Planck Institute for the Structure and Dynamics of Matter, Max Planck Society;

/persons/resource/persons22250

Wolf, Martin
Physical Chemistry, Fritz Haber Institute, Max Planck Society;

/persons/resource/persons104701

Rettig, Laurenz
Physical Chemistry, Fritz Haber Institute, Max Planck Society;

/persons/resource/persons21497

Ernstorfer, Ralph
Physical Chemistry, Fritz Haber Institute, Max Planck Society;

Externe Ressourcen

Es sind keine externen Ressourcen hinterlegt

Volltexte (beschränkter Zugriff)

Für Ihren IP-Bereich sind aktuell keine Volltexte freigegeben.

Volltexte (frei zugänglich)

2012.15328.pdf
(Preprint), 26MB

ntls.10010.pdf
(Verlagsversion), 2MB

Ergänzendes Material (frei zugänglich)

Es sind keine frei zugänglichen Ergänzenden Materialien verfügbar

Zitation

Dong, S., Puppin, M., Pincelli, T., Beaulieu, S., Christiansen, D., Hübener, H., et al. (2021). Direct measurement of key exciton properties: Energy, dynamics, and spatial distribution of the wave function. Natural Sciences, 1(1): e10010. doi:10.1002/ntls.10010.

Zitierlink: https://hdl.handle.net/21.11116/0000-0007-DA0F-4

Zusammenfassung

Excitons, Coulomb-bound electron-hole pairs, are the fundamental excitations governing optoelectronic properties of semiconductors. While optical signatures of excitons have been studied extensively, experimental access to the excitonic wave function itself has been elusive. Using multidimensional photoemission
spectroscopy, we present a momentum-, energy- and time-resolved perspective on
excitons in the layered semiconductor WSe₂. By tuning the excitation
wavelength, we determine the energy-momentum signature of bright exciton
formation and its difference from conventional single-particle excited states. The multidimensional data allows to retrieve fundamental exciton properties like the binding energy and the exciton-lattice coupling and to reconstruct the real-space excitonic wave function via Fourier transform. All quantities are in excellent agreement with microscopic calculations. Our approach provides a full characterization of the exciton wave function and is applicable to bright and dark excitons in semiconducting materials, heterostructures, and devices.