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Journal Article

XUV frequency comb production with an astigmatism-compensated enhancement cavity

MPS-Authors
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Nauta,  J.
Division Prof. Dr. Thomas Pfeifer, MPI for Nuclear Physics, Max Planck Society;

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Oelmann,  Jan-Hendrik
Division Prof. Dr. Thomas Pfeifer, MPI for Nuclear Physics, Max Planck Society;

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Borodin,  A.
Division Prof. Dr. Thomas Pfeifer, MPI for Nuclear Physics, Max Planck Society;

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Ackermann,  Alexander
Division Prof. Dr. Thomas Pfeifer, MPI for Nuclear Physics, Max Planck Society;

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Knauer,  P.
Division Prof. Dr. Thomas Pfeifer, MPI for Nuclear Physics, Max Planck Society;

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Pappenberger,  R.
Division Prof. Dr. Thomas Pfeifer, MPI for Nuclear Physics, Max Planck Society;

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Pfeifer,  T.
Division Prof. Dr. Thomas Pfeifer, MPI for Nuclear Physics, Max Planck Society;

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Crespo López Urrutia,  J. R.
Division Prof. Dr. Thomas Pfeifer, MPI for Nuclear Physics, Max Planck Society;

External Resource

https://doi.org/10.1364/OE.414987
(Publisher version)

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Fulltext (public)

2011.11339.pdf
(Preprint), 6MB

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Citation

Nauta, J., Oelmann, J.-H., Borodin, A., Ackermann, A., Knauer, P., Muhammad, I. S., et al. (2021). XUV frequency comb production with an astigmatism-compensated enhancement cavity. Optics Express, 29(2), 2624-2636. doi:10.1364/OE.414987.


Cite as: https://hdl.handle.net/21.11116/0000-0007-DB18-8
Abstract
We have developed an extreme ultraviolet (XUV) frequency comb for performing ultra-high precision spectroscopy on the many XUV transitions found in highly charged ions (HCI). Femtosecond pulses from a 100 MHz phase-stabilized near-infrared frequency comb are amplified and then fed into a femtosecond enhancement cavity (fsEC) inside an ultra-high vacuum chamber. The low-dispersion fsEC coherently superposes several hundred incident pulses and, with a single cylindrical optical element, fully compensates astigmatism at the w0 = 15 µm waist cavity focus. With a gas jet installed there, intensities reaching ∼ 1014 W/cm2 generate coherent high harmonics with a comb spectrum at 100 MHz rate. We couple out of the fsEC harmonics from the 7th up to the 35th (42 eV; 30 nm) to be used in upcoming experiments on HCI frequency metrology.