A model to predict image formation in the three-dimensional field ion microscope

Klaes, Benjamin; Lardé, Rodrigue; Delaroche, Fabien; Parviainen, Stefan; Rolland, Nicolas; Katnagallu, Shyam; Gault, Baptiste; Vurpillot, François

doi:10.1016/j.cpc.2020.107317

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A model to predict image formation in the three-dimensional field ion microscope

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Katnagallu, Shyam
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Gault, Baptiste
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;
Imperial College, Royal School of Mines, Department of Materials, London, SW7 2AZ, UK;

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Vurpillot, François
Normandie Université, UNIROUEN, INSA Rouen, CNRS, Groupe de Physique des Matériaux, 76000, Rouen, France;
Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Klaes, B., Lardé, R., Delaroche, F., Parviainen, S., Rolland, N., Katnagallu, S., et al. (2021). A model to predict image formation in the three-dimensional field ion microscope. Computer Physics Communications, 260: 107317. doi:10.1016/j.cpc.2020.107317.

Cite as: https://hdl.handle.net/21.11116/0000-0007-E185-4

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