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Bulklike behavior of magnetoelasticity in epitaxial Fe1-xGax thin films

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Sander,  Dirk
Nanophotonics, Integration, and Neural Technology, Max Planck Institute of Microstructure Physics, Max Planck Society;

Premper,  Jörg
Max Planck Institute of Microstructure Physics, Max Planck Society;

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Kirschner,  Jürgen
Max Planck Institute of Microstructure Physics, Max Planck Society;

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Citation

Barturen, M., Sander, D., Milano, J., Premper, J., Helman, C., Eddrief, M., et al. (2019). Bulklike behavior of magnetoelasticity in epitaxial Fe1-xGax thin films. Physical Review B, 99(13): 134432. doi:10.1103/PhysRevB.99.134432.


Cite as: https://hdl.handle.net/21.11116/0000-0008-2263-2
Abstract
BulkFe1-xGax alloys present a strong sensitivity of the magnetostrictive properties with Ga content with maximum magnetostriction near x=0.19. Here, we present magnetoelastic coefficients measured by the cantilever method on Fe1-xGax thin films grown by molecular beam epitaxy on GaAs(001). We find that Ga-dependent magnetoelastic coefficients in nanometer thin films are comparable in magnitude to the respective bulk values. Moreover, we compare thin films with a tetragonal structure due to a slightly preferential alignment of Ga pairs along the growth direction with and a cubic structure. It turns out that magnetoelastic coefficients are unaffected by a preferential alignment of Ga pairs along the growth direction.