Extended energy range analysis for angle-resolved time-of-flight photoelectron 
spectroscopy

Huth, Michael; Trützschler, Andreas; Chiang, Cheng-Tien; Kamrla, Robin; Schumann, Frank O.; Widdra, Wolf

doi:10.1063/1.5048515

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Extended energy range analysis for angle-resolved time-of-flight photoelectron spectroscopy

MPS-Authors

Huth, Michael
Max Planck Institute of Microstructure Physics, Max Planck Society;

Trützschler, Andreas
Max Planck Institute of Microstructure Physics, Max Planck Society;

Chiang, Cheng-Tien
Max Planck Institute of Microstructure Physics, Max Planck Society;

Kamrla, Robin
Max Planck Institute of Microstructure Physics, Max Planck Society;

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Schumann, Frank O.
Max Planck Institute of Microstructure Physics, Max Planck Society;

Widdra, Wolf
Max Planck Institute of Microstructure Physics, Max Planck Society;

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https://doi.org/10.1063/1.5048515
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引用

Huth, M., Trützschler, A., Chiang, C.-T., Kamrla, R., Schumann, F. O., & Widdra, W. (2018). Extended energy range analysis for angle-resolved time-of-flight photoelectron spectroscopy. Journal of Applied Physics, 124(16):. doi:10.1063/1.5048515.

引用: https://hdl.handle.net/21.11116/0000-0009-2726-1

要旨

An approximation method for electrostatic time-of-flight (ToF) spectroscopy on photoelectrons distributed over a wide energy range is presented. This method is an extension of conventional analysis and aims at specific energy and angular regions, where distinctly different emission angles and energies are mapped to the same ToF and detector position by the spectrometer. The general formulation and the systematic errors are presented, and a practical example is demonstrated for photoelectrons from Ag(001) with kinetic energies of 0.5–25 eV.