Item

Abstract

The principle of this novel technique of scanning photoemission microscopy (SPM) consists in recording the total yield of electrons emitted by UV light focussed onto a small spot on the surface through a microscope objective while the x,y-position is continuously varied. A 1 × 1 mm² image, for example, can be recorded within less than 10 sec with a lateral resolution of about 3 μm. The absolute work functions of selected spots can be determined by recording the electron yield as a function of photon energy. The method is perfectly non-destructive, even with sensitive adsorbed layers. Results are shown for a polycrystalline Pt surface and its interaction with oxygen and carbon monoxide.