Direct imaging of the two-dimensional Fermi contour: Fourier-transform STM

Petersen, L.; Sprunger, P. T.; Hofmann, Ph.; Lægsgaard, E.; Briner, Beat G.; Doering, Marcus; Rust, Hans-Peter; Bradshaw, Alexander M.; Besenbacher, F.; Plummer, E. W.

doi:10.1103/PhysRevB.57.R6858

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Direct imaging of the two-dimensional Fermi contour: Fourier-transform STM

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Briner, Beat G.
Fritz Haber Institute, Max Planck Society;

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Doering, Marcus
Fritz Haber Institute, Max Planck Society;

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Rust, Hans-Peter
Chemical Physics, Fritz Haber Institute, Max Planck Society;

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Bradshaw, Alexander M.
Fritz Haber Institute, Max Planck Society;

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Citation

Petersen, L., Sprunger, P. T., Hofmann, P., Lægsgaard, E., Briner, B. G., Doering, M., et al. (1998). Direct imaging of the two-dimensional Fermi contour: Fourier-transform STM. Physical Review B, 57(12), R6858-R6861. doi:10.1103/PhysRevB.57.R6858.

Cite as: https://hdl.handle.net/21.11116/0000-0008-B50C-F

Abstract

Direct images of the two-dimensional Fermi contour at a surface can be generated by a Fourier transform (FT) of scanning tunneling microscopy (STM) images taken at low-bias voltages. The origins of the Fermi contour in the FT are the standing waves of electrons near the Fermi energy caused by defects in the surface. Several examples of FT-STM are presented to illustrate the simplicity of this technique. The advantages and limitations of this Fermi contour imaging technique are discussed.