Atomic resolution of defects in graphite studied by STM

Atamny, F.; Baiker, A.; Schlögl, Robert

doi:10.1007/s002160050425

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Atomic resolution of defects in graphite studied by STM

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Schlögl, Robert
Inorganic Chemistry, Fritz Haber Institute, Max Planck Society;

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Atamny, F., Baiker, A., & Schlögl, R. (1997). Atomic resolution of defects in graphite studied by STM. Fresenius' Journal of Analytical Chemistry, 358(1-2), 344-348. doi:10.1007/s002160050425.

Cite as: https://hdl.handle.net/21.11116/0000-0008-E704-F

Abstract

Different kinds of defects in graphite with a resolution up to atomic scale have been investigated using STM. Mono-atomic steps on the surface as well as bended graphite layers with height differences less than 0.1 nm originating from defects (steps) in the bulk have been uncovered. The influence of such defects on the appearance of superstructures in the surrounding area is demonstrated. Ribbons, with a few nanometers width and less than 1 nm height, and prismatic loops were resolved. Height variations in the range of a few tenths of nanometer as a result of missed and inserted carbon layers have been revealed. To our knowledge, for the first time defect lines on graphite are presented with an atomic resolution. The defect lines are several microns long and only 1–3 atoms in width.