Field ion microscopy study of CO oxidation on palladium field emitter: field 
effects and imaging mechanism

Hammoudeh, A.; Naschitzki, Matthias

doi:10.1016/S0921-5093(99)00246-4

Item

ITEM ACTIONSEXPORT

Add to Basket

Local TagsRelease HistoryDetailsSummary

Released

Journal Article

Field ion microscopy study of CO oxidation on palladium field emitter: field effects and imaging mechanism

MPS-Authors

/persons/resource/persons21907

Naschitzki, Matthias
Chemical Physics, Fritz Haber Institute, Max Planck Society;

External Resource

No external resources are shared

Fulltext (restricted access)

There are currently no full texts shared for your IP range.

Fulltext (public)

There are no public fulltexts stored in PuRe

Supplementary Material (public)

There is no public supplementary material available

Citation

Hammoudeh, A., & Naschitzki, M. (1999). Field ion microscopy study of CO oxidation on palladium field emitter: field effects and imaging mechanism. Materials Science and Engineering A, 270(1), 89-93. doi:10.1016/S0921-5093(99)00246-4.

Cite as: https://hdl.handle.net/21.11116/0000-0009-0535-6

Abstract

Field ion microscopy (FIM) was applied in an attempt to monitor the kinetic oscillations in the CO oxidation rate. However, major difficulties arise due to field effects that enhance the CO dissociation leading to rapid poisoning of the surface with the formed carbon. On the other hand, it was found that the ionization of molecular oxygen that acts as the imaging gas under reaction conditions, occurs preferentially on oxygen adsorption sites in agreement with the mechanism of resonant field ionization. The imaging mechanism based on local work function influences on field ionization efficiency was discussed in view of the data obtained and was shown to be incorrect.