Impact of operational parameters on single beamlet deflection in a negative ion 
source for NBI applications

Hurlbatt, A.; Bonomo, F.; Orozco, G.; Nocentini, R.; Wimmer, C.; Fantz, U.

doi:10.1063/5.0057810

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Impact of operational parameters on single beamlet deflection in a negative ion source for NBI applications

MPS-Authors

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Hurlbatt, A.
ITER Technology & Diagnostics (ITED), Max Planck Institute for Plasma Physics, Max Planck Society;

/persons/resource/persons172891

Bonomo, F.
ITER Technology & Diagnostics (ITED), Max Planck Institute for Plasma Physics, Max Planck Society;

/persons/resource/persons130900

Orozco, G.
ITER Technology & Diagnostics (ITED), Max Planck Institute for Plasma Physics, Max Planck Society;

/persons/resource/persons110064

Nocentini, R.
ITER Technology & Diagnostics (ITED), Max Planck Institute for Plasma Physics, Max Planck Society;

/persons/resource/persons110802

Wimmer, C.
ITER Technology & Diagnostics (ITED), Max Planck Institute for Plasma Physics, Max Planck Society;

/persons/resource/persons109061

Fantz, U.
ITER Technology & Diagnostics (ITED), Max Planck Institute for Plasma Physics, Max Planck Society;

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Citation

Hurlbatt, A., Bonomo, F., Orozco, G., Nocentini, R., Wimmer, C., & Fantz, U. (2021). Impact of operational parameters on single beamlet deflection in a negative ion source for NBI applications. AIP Conference Proceedings, 2373(1): 030004. doi:10.1063/5.0057810.

Cite as: https://hdl.handle.net/21.11116/0000-0008-FE4C-6

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