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New techniques for imaging and identifying defects in electron microscopy

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Zaefferer,  Stefan
Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Gianola, D. S., Britton, T. B., & Zaefferer, S. (2020). New techniques for imaging and identifying defects in electron microscopy. MRS Bulletin, 44, 450-458. doi:10.1557/mrs.2019.125.


Cite as: https://hdl.handle.net/21.11116/0000-0009-0656-0
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