Towards a practical method for EELS quantification

Hofer, F.; Luo, B.

doi:10.1016/0304-3991(91)90117-O

Item

ITEM ACTIONSEXPORT

Add to Basket

Local TagsRelease HistoryDetailsSummary

Released

Journal Article

Towards a practical method for EELS quantification

MPS-Authors

/persons/resource/persons247743

Luo, B.
Fritz Haber Institute, Max Planck Society;

External Resource

No external resources are shared

Fulltext (restricted access)

There are currently no full texts shared for your IP range.

Fulltext (public)

There are no public fulltexts stored in PuRe

Supplementary Material (public)

There is no public supplementary material available

Citation

Hofer, F., & Luo, B. (1991). Towards a practical method for EELS quantification. Ultramicroscopy, 38(2), 159-167. doi:10.1016/0304-3991(91)90117-O.

Cite as: https://hdl.handle.net/21.11116/0000-0009-1F1D-6

Abstract

Inner-shell edge profiles for K-, L₂₃- and M₄₅-edges have been calculated by means of Hartree-Slater and hydrogenic wave functions and are compared to experimental data. The experimental differential cross-sections have been obtained by a modified<em>k</em>-factor approach from deconvoluted EEL spectra of binary oxides. The aim is to identify those features that are not predicted by the theories and to get some estimate of the accuracy of quantitative microanalysis by means of EELS.