Fundamentals and practical aspects of texture and microstructure measurements 
using EBSD-based orientation microscopy and related techniques

Zaefferer, Stefan

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Fundamentals and practical aspects of texture and microstructure measurements using EBSD-based orientation microscopy and related techniques

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Zaefferer, Stefan
Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Zaefferer, S. (2020). Fundamentals and practical aspects of texture and microstructure measurements using EBSD-based orientation microscopy and related techniques. January 2020. IIT Madras, India, 2020-01.

Cite as: https://hdl.handle.net/21.11116/0000-0009-2774-9

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