Microstructure Characterization in 2D and 3D using Advanced SEM-based Electron 
Diffraction Techniques

Zaefferer, Stefan

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Microstructure Characterization in 2D and 3D using Advanced SEM-based Electron Diffraction Techniques

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Zaefferer, Stefan
Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Zaefferer, S. (2019). Microstructure Characterization in 2D and 3D using Advanced SEM-based Electron Diffraction Techniques. Talk presented at Chongqing University Colloquium. Chongqing, China. 2019-11-26.

Cite as: https://hdl.handle.net/21.11116/0000-0009-2AE8-3

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