2D and 3D SEM-based electron diffraction techniques as central tools for 
correlative microscopy to obtain new insights into microstructure physics and 
chemistry

Zaefferer, Stefan

Item

ITEM ACTIONSEXPORT

Add to Basket

Local TagsRelease HistoryDetailsSummary

Released

Talk

2D and 3D SEM-based electron diffraction techniques as central tools for correlative microscopy to obtain new insights into microstructure physics and chemistry

MPS-Authors

/persons/resource/persons125491

Zaefferer, Stefan
Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

External Resource

No external resources are shared

Fulltext (restricted access)

There are currently no full texts shared for your IP range.

Fulltext (public)

There are no public fulltexts stored in PuRe

Supplementary Material (public)

There is no public supplementary material available

Citation

Zaefferer, S. (2021). 2D and 3D SEM-based electron diffraction techniques as central tools for correlative microscopy to obtain new insights into microstructure physics and chemistry. Talk presented at Kolloquium des Zentrums für Elektronenmikroskopie, online. Graz, Österreich. 2021-03-09.

Cite as: https://hdl.handle.net/21.11116/0000-0009-4C1B-5

Abstract

There is no abstract available