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Calibrating rectangular interferometer meshes with external photodetectors

MPS-Authors
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Alexiev,  Christopher
Nanophotonics, Integration, and Neural Technology, Max Planck Institute of Microstructure Physics, Max Planck Society;

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Sacher,  Wesley D.
Nanophotonics, Integration, and Neural Technology, Max Planck Institute of Microstructure Physics, Max Planck Society;

/persons/resource/persons257612

Poon,  Joyce K. S.       
Nanophotonics, Integration, and Neural Technology, Max Planck Institute of Microstructure Physics, Max Planck Society;

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Citation

Alexiev, C., Mak, J. C. C., Sacher, W. D., & Poon, J. K. S. (2021). Calibrating rectangular interferometer meshes with external photodetectors. OSA Continuum, 4(11), 2892-2904. doi:10.1364/OSAC.437918.


Cite as: https://hdl.handle.net/21.11116/0000-0009-75BB-1
Abstract
Multiport interferometer meshes can be used to implement unitary transformations on input vectors of light in both the classical and quantum domain. In practice, the phase-shifters in a mesh photonic circuit must be calibrated to compensate for phase errors due to fabrication variations. Calibration using photodetectors external to the mesh has been demonstrated for triangular meshes, but not rectangular meshes. Here, we propose an algorithm for the calibration of rectangular meshes using only external photodetectors and simulate it to evaluate its feasibility.