Saseendran, A., Skubch, K., & Keuper, M. (2021). Multi-Class Multi-Instance Count
Conditioned Adversarial Image Generation. In IEEE/CVF International Conference on Computer Visio
(pp. 6742-6751). Piscataway, NJ: IEEE. doi:10.1109/ICCV48922.2021.00669.