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Journal Article

Determination of the position maximum for electron Compton scattering in electron microscopy

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Su,  Dang Sheng
Inorganic Chemistry, Fritz Haber Institute, Max Planck Society;

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Zeitler,  Elmar
Inorganic Chemistry, Fritz Haber Institute, Max Planck Society;

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PhysRevB.49.8552.pdf
(Publisher version), 228KB

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Citation

Su, D. S., Schattschneider, P., & Zeitler, E. (1994). Determination of the position maximum for electron Compton scattering in electron microscopy. Physical Review B, 49(13), 8552-8556. doi:10.1103/PhysRevB.49.8552.


Cite as: https://hdl.handle.net/21.11116/0000-0009-8D5E-0
Abstract
We study electron Compton scattering with an electron microscope by means of a Castaing-Henry filter. In the electron-spectroscopic-diffraction mode the positions of the Compton maxima in the diffraction plane are determined. We find a nearly constant shift of this position with respect to the value given by E=q2/2. The intensity of Compton-scattered electrons does not peak at the scattering angle predicted by the binary collision mode. The energy dispersion of the Compton profile is well described by E=q2/2.