Lineshape asymmetry parameters in X-ray photoelectron spectra

Yarzhemsky, V.G.; Reich, T.; Chernysheva, L.V.; Streubel, P.; Szargan, R.

doi:10.1016/0368-2048(95)02382-8

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Lineshape asymmetry parameters in X-ray photoelectron spectra

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Reich, T.
Fritz Haber Institute, Max Planck Society;

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Yarzhemsky, V., Reich, T., Chernysheva, L., Streubel, P., & Szargan, R. (1996). Lineshape asymmetry parameters in X-ray photoelectron spectra. Journal of Electron Spectroscopy and Related Phenomena, 77(1), 15-24. doi:10.1016/0368-2048(95)02382-8.

Cite as: https://hdl.handle.net/21.11116/0000-0009-AC86-E

Abstract

A new type of lineshape asymmetry parameter in X-ray photoelectron spectra is proposed. The widths and asymmetry parameters of 2s photoelectron lines are calculated for Mg and all atoms from Si to Sc and measured experimentally for atoms from Si to Ca. It is shown that the intrinsic asymmetry of 2s photoelectron lines due to Coster-Kronig decay is reversed with respect to the asymmetry due to inelastic photoelectron scattering and Fermi-surface relaxation. Theoretical widths of P2s and S2s photoelectron lines agree with the experimental data obtained with monochromatized Al Kα radiation.