Fischer, Jonas Databases and Information Systems, MPI for Informatics, Max Planck Society;
arXiv:2110.09599.pdf (Preprint), 568KB
Hedderich, M., Fischer, J., Klakow, D., & Vreeken, J. (2021). Label-Descriptive Patterns and their Application to Characterizing Classification Errors. Retrieved from https://arxiv.org/abs/2110.09599.