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Monitoring Oxide Layer Growth on Manganese Electrodes, by in situ Spectroscopic Ellipsometry and Raman Spectroscopy

MPS-Authors
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Rabe,  Martin
Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Sarfraz,  Adnan
Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Erbe,  Andreas
Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;
Department of Materials Science and Engineering, NTNU - Norwegian University of Science and Technology, 7491 Trondheim, Norway;

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Citation

Rabe, M., Sarfraz, A., & Erbe, A. (2016). Monitoring Oxide Layer Growth on Manganese Electrodes, by in situ Spectroscopic Ellipsometry and Raman Spectroscopy. Poster presented at 67th Annual Meeting of the ISE, Den Haag, The Netherlands.


Cite as: https://hdl.handle.net/21.11116/0000-0009-F286-E
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