REM studies of surface crystallography

Lehmpfuhl, Günter; Uchida, Yuji

doi:10.1016/0304-3991(93)90120-M

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REM studies of surface crystallography

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Lehmpfuhl, Günter
Fritz Haber Institute, Max Planck Society;

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Uchida, Yuji
Fritz Haber Institute, Max Planck Society;

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Citation

Lehmpfuhl, G., & Uchida, Y. (1993). REM studies of surface crystallography. Ultramicroscopy, 48(4), 445-451. doi:10.1016/0304-3991(93)90120-M.

Cite as: https://hdl.handle.net/21.11116/0000-000A-03F6-D

Abstract

Reflection electron microscopy (REM) allows a very accurate determination of crystallographic directions on a surface. The lack of resolution in REM due to foreshortening is compensated by enhanced sensitivity for measuring angular differences of these directions. This is shown by sequences of atomic steps on Pt(100). The lattice of reconstruction on (100) and (111) surfaces of gold could directly be imaged with a separation of approximately 4.0 nm and 6.7 nm, respectively.