Abstract
Basic concepts for the development of various forms of emission microscopy are discussed. It is proposed that all types of charged particles leaving a surface can be used to image the surface using a technique of emission microscopy. Angular distributions of all types of charged particles can be viewed by projection of the back oocal plane of an emission lens. Most familiar forms of spectroscopy used in surface science and involving charged particles can be combined, in principle, with a technique of emission microscopy. The following techniques are discussed: low-energy electron microscopy (LEEM) and diffraction (LEED), Auger electron emission microscopy and angular-resolved Auger electron spectroscopy (ARAES), electron energy-loss emission microscopy (EELS microscopy), secondary electron emission microscopy, thermionic emission electron microscopy, electron-stimulated desorption ion microscopy and electron-stimulated desorption ion angular distributions (ESDIAD), inverse photoemission microscopy, UV photoelectron emission microscopy and diffraction, X-ray photoelectron emission microscopy and diffraction, scanning photoelectron emission microscopy at atmospheric pressure and above, photon-stimulated desorption ion microscopy and photon-stimulated desorption ion angular distributions, ion neutralization electron microscopy, Penning ionization electron emission microscopy, secondary ion mass spectroscopy microscopy (SIMS microscopy), thermal ionization emission microscopy, exo-emission microscopy and positron emission microscopy.
