Help Privacy Policy Disclaimer
  Advanced SearchBrowse




Journal Article

Electron pair emission from surfaces: some general experimental considerations


Schumann,  F. O.       
Department of Synthetic Materials and Functional Devices (SMFD), Max Planck Institute of Microstructure Physics, Max Planck Society;

External Resource
Fulltext (restricted access)
There are currently no full texts shared for your IP range.
Fulltext (public)

(Preprint), 3MB

Supplementary Material (public)
There is no public supplementary material available

Kamrla, R., Widdra, W., Chiang, C.-T., & Schumann, F. O. (2022). Electron pair emission from surfaces: some general experimental considerations. Journal of Electron Spectroscopy and Related Phenomena, 257: 147185. doi:10.1016/j.elspec.2022.147185.

Cite as: https://hdl.handle.net/21.11116/0000-000A-5B9C-1
We discuss some experimental facets of electron pair emission from surfaces using two different experimental approaches. In the first case the instrument consists of a pair of hemispherical analyzers which are operated with continuous primary beams of electrons or photons. The second instrument employs a pair of time-of-flight spectrometers which require a pulsed excitation source. A key experimental quantity is the ratio of ‘true’ to ‘random’ coincidences which can be determined in different ways. Regardless of the type of instrument the primary flux has to adopt a much smaller value than in single electron spectroscopy. We describe different approaches to obtain the relevant count rates, in particular the concept of operating with a delayed coincidence circuit. We also address the question on how to compare the two types of spectrometer in terms of their performance.