The effect of secondary electrons on radiolysis as observed by in liquid TEM: 
The role of window material and electrical bias

Bultema, L.; Bücker, R.; Schulz, E.-C.; Tellkamp, F.; Gonschior, J.; Miller, R. J. D.; Kassier, G.

doi:10.1016/j.ultramic.2022.113579

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The effect of secondary electrons on radiolysis as observed by in liquid TEM: The role of window material and electrical bias

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Bultema, L.
International Max Planck Research School for Ultrafast Imaging & Structural Dynamics (IMPRS-UFAST), Max Planck Institute for the Structure and Dynamics of Matter, Max Planck Society;
Miller Group, Atomically Resolved Dynamics Department, Max Planck Institute for the Structure and Dynamics of Matter, Max Planck Society;

Schulz, E.-C.
Miller Group, Atomically Resolved Dynamics Department, Max Planck Institute for the Structure and Dynamics of Matter, Max Planck Society;
Universität Hamburg, HARBOR;

Tellkamp, F.
Machine Physics, Scientific Service Units, Max Planck Institute for the Structure and Dynamics of Matter, Max Planck Society;

Gonschior, J.
Miller Group, Atomically Resolved Dynamics Department, Max Planck Institute for the Structure and Dynamics of Matter, Max Planck Society;

Kassier, G.
Miller Group, Atomically Resolved Dynamics Department, Max Planck Institute for the Structure and Dynamics of Matter, Max Planck Society;

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https://doi.org/10.1016/j.ultramic.2022.113579
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ScienceDirect_files_11Jul2022_09-07-12.883.zip
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Citation

Bultema, L., Bücker, R., Schulz, E.-C., Tellkamp, F., Gonschior, J., Miller, R. J. D., et al. (2022). The effect of secondary electrons on radiolysis as observed by in liquid TEM: The role of window material and electrical bias. Ultramicroscopy, 240: 113579. doi:10.1016/j.ultramic.2022.113579.

Cite as: https://hdl.handle.net/21.11116/0000-000A-B314-5

Abstract

The effect of window material on electron beam induced phenomena in liquid phase electron microscopy (LPEM) is an interesting yet under-explored subject. We have studied the differences of electron beam induced gold nanoparticle (AuNP) growth subject to three encapsulation materials: Silicon Nitride (Si₃N₄), carbon and formvar. We find Si₃N₄ liquid cells (LCs) to result in significantly higher AuNP growth yield as compared to LCs employing the other two materials. In all cases, an electrical bias of the entire LC structures significantly affected particle growth. We demonstrate an inverse correlation of the AuNP growth rate with secondary electron (SE) emission from the windows. We attribute these differences at least in part to variations in SE emission dynamics, which is seen as a combination of material and bias dependent SE escape flux (SEEF) and SE return flux (SERF). Furthermore, our model predictions qualitatively match electrochemistry expectations.