English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT

Released

Patent

Method and apparatus for measuring and monitoring optical properties based on a ring-resonator

MPS-Authors
/persons/resource/persons75462

Fischer,  Peer       
Max Planck Institute for Medical Research, Max Planck Society;

Fulltext (restricted access)
There are currently no full texts shared for your IP range.
Fulltext (public)
There are no public fulltexts stored in PuRe
Supplementary Material (public)
There is no public supplementary material available
Citation

Vollmer, F., & Fischer, P.(2008). Method and apparatus for measuring and monitoring optical properties based on a ring-resonator.


Cite as: https://hdl.handle.net/21.11116/0000-000A-F4C8-1
Abstract
A method and apparatus for performing refractive index, birefringence and optical activity measurements of a material such as a solid, liquid, gas or thin film is disclosed. The method and apparatus can also be used to measure the properties of a reflecting surface. The disclosed apparatus has an optical ring-resonator in the form of a fiber-loop resonator, or a race-track resonator, or any waveguide-ring or other structure with a closed optical path that constitutes a cavity. A sample is introduced into the optical path of the resonator such that the light in the resonator is transmitted through the sample and relative and/or absolute shifts of the resonance frequencies or changes of the characteristics of the transmission spectrum are observed. A change in the transfer characteristics of the resonant ring, such as a shift of the resonance frequency, is related to a sample's refractive index (refractive indices) and/or change thereof. In the case of birefringence measurements, rings that have modes with two (quasi)-orthogonal (linear or circular) polarization states are used to observe the relative shifts of the resonance frequencies. A reflecting surface may be introduced in a ring resonator. The reflecting surface can be raster-scanned for the purpose of height-profiling surface features. A surface plasmon resonance may be excited and phase changes of resonant light due to binding of analytes to the reflecting surface can be determined in the frequency domain.