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Abstract

We report on the implementation of a versatile dynamic mode
apertureless scanning near field optical microscope (aSNOM) for
nanoscopic investigations of optical properties at surfaces and
interfaces. The newly developed modular aSNOM optomechanical unit is
essentially integrable with a multitude of laser sources, homemade
scanning probe microscopes (SPMs) as well as commercially available
SPMs as demonstrated here. The instrument is especially designed to
image opaque surfaces without a restriction to transparent substrates.
In the description of the instrument we draw frequent attention to
various possible artifact mechanisms, how to overcome them, and we
present effective checks to ensure true near field optical contrast.
Lateral optical contrast in optical amplitude and phase images below 10
nm is demonstrated. (c) 2006 American Institute of Physics.