English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT

Released

Journal Article

Structural investigation of hierarchically self-assembled GaAs/AlGaAs quantum dots

MPS-Authors
/persons/resource/persons280417

Rastelli,  A.
Former Scientific Facilities, Max Planck Institute for Solid State Research, Max Planck Society;
Department Nanoscale Science (Klaus Kern), Max Planck Institute for Solid State Research, Max Planck Society;

/persons/resource/persons280485

Schmidt,  O. G.
Former Scientific Facilities, Max Planck Institute for Solid State Research, Max Planck Society;
Scientific Facility Nanostructuring Lab (Jürgen Weis), Max Planck Institute for Solid State Research, Max Planck Society;
Abteilung v. Klitzing, Former Departments, Max Planck Institute for Solid State Research, Max Planck Society;
Department Nanoscale Science (Klaus Kern), Max Planck Institute for Solid State Research, Max Planck Society;

External Resource
No external resources are shared
Fulltext (restricted access)
There are currently no full texts shared for your IP range.
Fulltext (public)
There are no public fulltexts stored in PuRe
Supplementary Material (public)
There is no public supplementary material available
Citation

Lenz, A., Timm, R., Eisele, H., Ivanova, L., Martin, D., Vosseburger, V., et al. (2006). Structural investigation of hierarchically self-assembled GaAs/AlGaAs quantum dots. physica status solidi (b), 243(15), 3976-3980.


Cite as: https://hdl.handle.net/21.11116/0000-000F-011B-2
Abstract
Recent investigations of self-organized unstrained inverted GaAs/AlGaAs
quantum dots, prepared by a combination of Stranski-Krastanov growth
mode and an in situ etching technique, show GaAs quantum dots with
large confinement energy and high size homogeneity. Here we present
first cross-sectional scanning tunneling microscopy data of these
quantum dots, characterized by a lateral extension of about 35 nm,
heights of about 5-6 nm, and a reversed truncated pyramidal shape. We
further observe a decomposition of the AlGaAs host layers and a
roughening of the AlGaAs/GaAs interfaces. (C) 2006 WILEY-VCH Verlag
GmbH & Co. KGaA, Weinheim.