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The interrelation between adhesion, contact creep, and roughness on the life of gold contacts in radio-frequency microswitches

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Gregori,  G.
Department Physical Chemistry of Solids (Joachim Maier), Max Planck Institute for Solid State Research, Max Planck Society;

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Citation

Gregori, G., & Clarke, D. R. (2006). The interrelation between adhesion, contact creep, and roughness on the life of gold contacts in radio-frequency microswitches. Journal of Applied Physics, 100(9): 094904.


Cite as: https://hdl.handle.net/21.11116/0000-000E-FFFF-5
Abstract
With repeated actuation, an increasing adhesive force develops between
the gold contacts of radio-frequency microswitches until failure
eventually occurs by stiction. Detailed characterization of the contact
forces and the contact surfaces as a function of actuation cycles for
"cold-switched" devices indicates that the increase in adhesive forces
in air is attributed to mechanical creep of the polycrystalline gold
contacts. The increase in adhesion is observed to be associated with an
increase in contact area and depth of contact impression as well as
asperity flattening. These morphological observations are related to
the propensity for stiction using two nondimensional numbers, the
plasticity index psi and the adhesion parameter theta. Trajectories of
the evolution of contact roughness in terms of these two numbers
provide insight into the design of contacts to resist stiction. (c)
2006 American Institute of Physics.