Experimental evidence of the dominant role of low-angle grain boundaries for 
the critical current density in epitaxially grown YBa2Cu3O7-δ thin films

Brück, S.; Albrecht, J.

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Experimental evidence of the dominant role of low-angle grain boundaries for the critical current density in epitaxially grown YBa₂Cu₃O_7-δ thin films

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Albrecht, J.
Scientific Facility Thin Film Technology (Gennady Logvenov), Max Planck Institute for Solid State Research, Max Planck Society;

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Brück, S., & Albrecht, J. (2005). Experimental evidence of the dominant role of low-angle grain boundaries for the critical current density in epitaxially grown YBa₂Cu₃O_7-δ thin films. Physical Review B, 71(17): 174508.

Cite as: https://hdl.handle.net/21.11116/0000-000E-F9A1-3

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